Analysis techniques
Thanks to its wide range of surface characterisation techniques, Science et Surface can select the techniques that meet your requirements.
The performances of each technique are presented in the schema and table below :
Elementary | Quanti | Chemical | Sensitivity | Depth profiling | Spot size |
Profile | Insulators | |
---|---|---|---|---|---|---|---|---|
XPS | yes | yes | yes | 0,1 % at. | 10 nm | 10 µm | yes -> 1 µm |
yes |
AES | yes | yes | yes | 0,1 % at. | 10 nm | 0,1 µm | yes -> 1 µm |
no |
DSIMS | yes | difficult | no | ppm-ppb | – | 0,3 µm | yes -> 10 µm |
yes |
SSIMS | yes | difficult | yes molecular | femtomole | < 1 nm | 0,3 µm | – | yes |
GD-OES | yes | yes | no | ppm | – | no | yes -> 100 µm |
yes (RF) |
EDS (SEM) |
yes | yes | no | 0,1 % at. | 1 µm | 1 µm | no | yes |
FTIR |
no | no | yes molecular | 1000 ppm | 1 µm | 3 µm | no | yes |
TEM |
yes with EDS | yes with EDS | yes with EELS | 1%at. | 100 nm | down to the nanometer | no | yes |
Science et Surface also carries out material analyses with its partner laboratories: XRD, ICP-MS, GD-MS, HS-GCMS, DSC, ATG, pyrolysis GC-MS, micro-hardness, viscosity measurement, water content, ageing tests, corrosion tests, etc. and other analyses on request.