Analysis techniques

Thanks to its wide range of surface characterisation techniques, Science et Surface can select the techniques that meet your requirements.

The performances of each technique are presented in the schema and table below :

	Elementary	Quanti	Chemical	Sensitivity	Depth profiling	Spot size	Profile	Insulators
XPS	yes	yes	yes	0,1 % at.	10 nm	10 µm	yes -> 1 µm	yes
AES	yes	yes	yes	0,1 % at.	10 nm	0,1 µm	yes -> 1 µm	no
DSIMS	yes	difficult	no	ppm-ppb	–	0,3 µm	yes -> 10 µm	yes
SSIMS	yes	difficult	yes molecular	femtomole	< 1 nm	0,3 µm	–	yes
GD-OES	yes	yes	no	ppm	–	no	yes -> 100 µm	yes (RF)
EDS (SEM)	yes	yes	no	0,1 % at.	1 µm	1 µm	no	yes
FTIR	no	no	yes molecular	1000 ppm	1 µm	3 µm	no	yes
TEM	yes with EDS	yes with EDS	yes with EELS	1%at.	100 nm	down to the nanometer	no	yes

Science et Surface also carries out material analyses with its partner laboratories: XRD, ICP-MS, GD-MS, HS-GCMS, DSC, ATG, pyrolysis GC-MS, micro-hardness, viscosity measurement, water content, ageing tests, corrosion tests, etc. and other analyses on request.